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IEEE3d
Single Event Upset Characterization of Microsemi RISC-V Softcore Processors on Polarfire MPF300T-1FCG1152E FPGA Using Proton Irradiation - IEEE Xplore
SEU cross-sections of the Polarfire FPGA programmed with various Microsemi RISC-V Softcore processors are presented. Upset rates in the space radiation environment are estimated and found to be ...
IEEE3d
TID and SEE Characterization of Microsemi's 4th Generation Radiation Tolerant RTG4 Flash-Based FPGA - IEEE Xplore
TID and SEE characterization of Microsemi's 4th generation RTG4 flash-based FPGA is presented. The radiation performance of RTG4 is compared to SmartFusion2, Microsemi's 4th generation commercial ...