In figure 1, we present a single wafer defect map, lot stack defect map and lot stack probe bin map. In the map for a stacked probe map with a micro crack (fig 1c), the red dies indicate the frequency ...

"Achieving wafer-scale control of stacking order is an important milestone for scalable, high-performance 2D electronic and photonic systems," said Seokho Moon, a postdoctoral researcher in ...