In the case of an event at a nuclear installation it is important to accurately determine the root causes, in order to allow corrective actions to be implemented to address them and prevent their ...
Symposium on Physical and Failure Analysis of Integrated Circuits, pp 84 – 89 , 2002. [5] C.C. Ooi,, K.H. Siek, K.S. Sim, “Application of focused ion beam system as a defect localization and root ...
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